Semantic Scholar Open Access 2016 19 sitasi

Fatigue life prediction model for accelerated testing of electronic components under non-Gaussian random vibration excitations

Yu Jiang J. Tao Yun-An Zhang G. Yun

Penulis (4)

Y

Yu Jiang

J

J. Tao

Y

Yun-An Zhang

G

G. Yun

Format Sitasi

Jiang, Y., Tao, J., Zhang, Y., Yun, G. (2016). Fatigue life prediction model for accelerated testing of electronic components under non-Gaussian random vibration excitations. https://doi.org/10.1016/j.microrel.2016.07.018

Akses Cepat

Informasi Jurnal
Tahun Terbit
2016
Bahasa
en
Total Sitasi
19×
Sumber Database
Semantic Scholar
DOI
10.1016/j.microrel.2016.07.018
Akses
Open Access ✓