Semantic Scholar Open Access 2025

Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree

Qian Cao L. Liang

Abstrak

Negative Ion Source Neutral beam Injection (NNBI), as a critical auxiliary heating system for magnetic confinement fusion devices, directly affects the plasma heating efficiency of tokamak devices through the reliability of its beam source system. The single-shot experiment constitutes a significant experimental program for NNBI. This study addresses the frequent equipment failures encountered by the NNBI beam source system during a cycle of experiments, employing fault tree analysis (FTA) to conduct a systematic reliability assessment. Utilizing the AutoFTA 3.9 software platform, a fault tree model of the beam source system was established. Minimal cut set analysis was performed to identify the system’s weak points. The research employed AutoFTA 3.9 for both qualitative analysis and quantitative calculations, obtaining the failure probabilities of critical components. Furthermore, the F-V importance measure and mean time between failures (MTBF) were applied to analyze the system. This provides a theoretical basis and practical engineering guidance for enhancing the operational reliability of the NNBI system. The evaluation methodology developed in this study can be extended and applied to the reliability analysis of other high-power particle acceleration systems.

Penulis (2)

Q

Qian Cao

L

L. Liang

Format Sitasi

Cao, Q., Liang, L. (2025). Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree. https://doi.org/10.3390/app15158556

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Informasi Jurnal
Tahun Terbit
2025
Bahasa
en
Sumber Database
Semantic Scholar
DOI
10.3390/app15158556
Akses
Open Access ✓