Semantic Scholar Open Access 2013 516 sitasi

Second harmonic microscopy of monolayer MoS 2

Nardeep Kumar S. Najmaei Q. Cui F. Ceballos P. Ajayan +2 lainnya

Lihat Sumber DOI

Abstrak

We show that the lack of inversion symmetry in monolayer MoS2 allows strong optical second harmonic generation. Second harmonic of an 810-nm pulse is generated in a mechanically exfoliated monolayer, with a nonlinear susceptibility on the order of 1E-7 m/V. The susceptibility reduces by a factor of seven in trilayers, and by about two orders of magnitude in even layers. A proof-of-principle second harmonic microscopy measurement is performed on samples grown by chemical vapor deposition, which illustrates potential applications of this effect in fast and non-invasive detection of crystalline orientation, thickness uniformity, layer stacking, and single-crystal domain size of atomically thin films of MoS2 and similar materials.

Topik & Kata Kunci

Materials Science Physics

Penulis (7)

Nardeep Kumar

S. Najmaei

Q. Cui

F. Ceballos

P. Ajayan

J. Lou

Hui Zhao

Format Sitasi

APA MLA BibTeX

Kumar, N., Najmaei, S., Cui, Q., Ceballos, F., Ajayan, P., Lou, J. et al. (2013). Second harmonic microscopy of monolayer MoS 2. https://doi.org/10.1103/PhysRevB.87.161403

Akses Cepat

Lihat di Sumber doi.org/10.1103/PhysRevB.87.161403

Informasi Jurnal

Tahun Terbit: 2013
Bahasa: en
Total Sitasi: 516×
Sumber Database: Semantic Scholar
DOI: 10.1103/PhysRevB.87.161403
Akses: Open Access ✓