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Semantic Scholar Open Access 2025

Investigating 4H-SiC epilayer thickness variation in high-resolution Ni/Y₂O₃/4H-SiC MOS detectors

Ritwika Nag Cihan Öner S. Chaudhuri K. C. Mandal
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Penulis (4)

R

Ritwika Nag

C

Cihan Öner

S

S. Chaudhuri

K

K. C. Mandal

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Nag, R., Öner, C., Chaudhuri, S., Mandal, K.C. (2025). Investigating 4H-SiC epilayer thickness variation in high-resolution Ni/Y₂O₃/4H-SiC MOS detectors. https://doi.org/10.1007/s10854-025-16272-y

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Informasi Jurnal
Tahun Terbit
2025
Bahasa
en
Sumber Database
Semantic Scholar
DOI
10.1007/s10854-025-16272-y
Akses
Open Access ✓