Semantic Scholar Open Access 1977 1567 sitasi

An assessment of high voltage electron microscopy (HVEM). An invited review

M. Loretto R. Smallman

Lihat Sumber DOI

Topik & Kata Kunci

Materials Science

Penulis (2)

M. Loretto

R. Smallman

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Loretto, M., Smallman, R. (1977). An assessment of high voltage electron microscopy (HVEM). An invited review. https://doi.org/10.1016/0025-5416(77)90085-4

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Informasi Jurnal

Tahun Terbit: 1977
Bahasa: en
Total Sitasi: 1567×
Sumber Database: Semantic Scholar
DOI: 10.1016/0025-5416(77)90085-4
Akses: Open Access ✓