DOAJ Open Access 2013

Brief Presentation of Near-field Test Application in EMC Diagnostic

HOU De-chao SHAO Rui YANG Tian-fan

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Abstrak

According to the problem of EMI source hard positioning in EMI test, a near-field diagnostic test systems was presented with different dimension and type near-field probe to position larger radiation point accurately, which provided a fast and effective positioning method to complete radiation EMI fault diagnostic and guided practical application.

Topik & Kata Kunci

Railroad engineering and operation

Penulis (3)

HOU De-chao

SHAO Rui

YANG Tian-fan

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De-chao, H., Rui, S., Tian-fan, Y. (2013). Brief Presentation of Near-field Test Application in EMC Diagnostic. http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.03.006

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Tahun Terbit: 2013
Sumber Database: DOAJ
Akses: Open Access ✓