Measuring varve thickness using micro-computed tomography (µCT): a comparison with thin section

<p>X-ray micro-computed tomography (<span class="inline-formula">µ</span>CT) scans were performed on four varved sediment cores collected in Grand Lake (Labrador) and previously studied with thin sections. These scans allowed us to investigate the possibility of using <span class="inline-formula">µ</span>CT as a substitute for thin sections to carry out counts and thickness measurements of varved sediments. Comparing varve counts of these two methods, <span class="inline-formula">µ</span>CT counts are slightly higher than the ones made with thin sections. The difference in counts suggests that the petrographic study and a scanning electron microscope (SEM) analysis of a thin section remain necessary for determining the varve character of the laminae. Yet, <span class="inline-formula">µ</span>CT allows measurements in multiple directions, improving the robustness of the counts and avoiding the manufacturing of continuous thin sections along a sediment sequence. As for the thickness measurement, the <span class="inline-formula">µ</span>CT analyses were made in two perpendicular directions. Not surprisingly, measurements made on the same cutting plane as the thin section are quite similar to the ones made on the latter. However, there are significant differences with measurements made on the perpendicular plane. This highlights the need to perform varve thickness measurements in at least two perpendicular directions for better estimates of varved sediment thicknesses. In addition, the study illustrates that <span class="inline-formula">µ</span>CT is an effective way to select the least deformed zones with parallel varves to carry out the best possible thickness measurements.</p>