DOAJ Open Access 2021

Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector

Matheus Rebello do Nascimento Jose Guilherme Pereira Peixoto Leonardo de Castro Pacífico Eric Matos Macêdo

Abstrak

The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on ISO 4037-1 standard. The error percentages calculated were 2%, 2%, 2%, 11%, 9%, and 6%, respectively, related to partial energy deposition, efficiency loss, and charge trapping. These results suggest the need for correction of measured spectra, mainly for voltages higher than 30 kV.

Penulis (4)

M

Matheus Rebello do Nascimento

J

Jose Guilherme Pereira Peixoto

L

Leonardo de Castro Pacífico

E

Eric Matos Macêdo

Format Sitasi

Nascimento, M.R.d., Peixoto, J.G.P., Pacífico, L.d.C., Macêdo, E.M. (2021). Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector. https://doi.org/10.15392/bjrs.v9i2C.1665

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Informasi Jurnal
Tahun Terbit
2021
Sumber Database
DOAJ
DOI
10.15392/bjrs.v9i2C.1665
Akses
Open Access ✓