DOAJ Open Access 2017

Filtration influence in a constant potential X-ray machine peak voltage measurements

Lucas Rodrigues Santos Vitor Vivolo Marcus Vinícius Teixeira Navarro Marcos Xavier Maria da Penha Albuquerque Potiens

Abstrak

This work shows the peak voltage measurements for several beam filtrations used in diagnostic radiology, using two types of non-invasive detectors; a voltage meter and a high-resolution spectrometer. The technique chosen for the voltage peak measurements with the spectrometer was the endpoint. The results were compared to the measured ones and showed good similarity to the nominal values. However the voltage meter detector used in this work presented errors for heavier filtrations.

Penulis (5)

L

Lucas Rodrigues Santos

V

Vitor Vivolo

M

Marcus Vinícius Teixeira Navarro

M

Marcos Xavier

M

Maria da Penha Albuquerque Potiens

Format Sitasi

Santos, L.R., Vivolo, V., Navarro, M.V.T., Xavier, M., Potiens, M.d.P.A. (2017). Filtration influence in a constant potential X-ray machine peak voltage measurements. https://doi.org/10.15392/bjrs.v5i2.261

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Informasi Jurnal
Tahun Terbit
2017
Sumber Database
DOAJ
DOI
10.15392/bjrs.v5i2.261
Akses
Open Access ✓