DOAJ Open Access 2020

Performance Degradation Based Lifetime Evaluation of Power Electronic Devices

Guangze PAN Zheng ZHANG Qin LUO Xiaobing LI Linghui MENG

Abstrak

Current lifetime evaluation methods are often ineffective for power electronic devices which have high reliability, long life, and multi-fault mode competition. Accordingly, a lifetime evaluation method based on performance degradation data is proposed. Such data is used to construct performance degradation and lifetime distribution models. Then, the model parameter estimation, model goodness-of-fit checking, and model optimization methods are derived. By considering the trends in the degradation of multiple performance parameters, a competitive failure model is constructed to achieve a fast evaluation for the lifetime of power electronic devices with high reliability, long life, and multi-fault mode competition. As an example, lifetime evaluation is carried out for an insulated gate bipolar transistor. The difference between the evaluation results and measured test results is small, which verifies that the proposed method is quite accurate and effective.

Topik & Kata Kunci

Electricity Production of electric energy or power. Powerplants. Central stations

Penulis (5)

Guangze PAN

Zheng ZHANG

Qin LUO

Xiaobing LI

Linghui MENG

Format Sitasi

APA MLA BibTeX

PAN, G., ZHANG, Z., LUO, Q., LI, X., MENG, L. (2020). Performance Degradation Based Lifetime Evaluation of Power Electronic Devices. https://doi.org/10.11930/j.issn.1004-9649.201907027

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Informasi Jurnal

Tahun Terbit: 2020
Sumber Database: DOAJ
DOI: 10.11930/j.issn.1004-9649.201907027
Akses: Open Access ✓