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DOAJ Open Access 2017

Erratum to: Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire

Bogdan I. Tsykaniuk Andrii S. Nikolenko Viktor V. Strelchuk Viktor M. Naseka Yuriy I. Mazur +7 lainnya
Lihat Sumber DOI

Topik & Kata Kunci

Materials of engineering and construction. Mechanics of materials

Penulis (12)

B

Bogdan I. Tsykaniuk

A

Andrii S. Nikolenko

V

Viktor V. Strelchuk

V

Viktor M. Naseka

Y

Yuriy I. Mazur

M

Morgan E. Ware

E

Eric A. DeCuir

B

Bogdan Sadovyi

J

Jan L. Weyher

R

Rafal Jakiela

G

Gregory J. Salamo

A

Alexander E. Belyaev

Format Sitasi

APA MLA BibTeX
Tsykaniuk, B.I., Nikolenko, A.S., Strelchuk, V.V., Naseka, V.M., Mazur, Y.I., Ware, M.E. et al. (2017). Erratum to: Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire. https://doi.org/10.1186/s11671-017-2227-1

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Informasi Jurnal
Tahun Terbit
2017
Sumber Database
DOAJ
DOI
10.1186/s11671-017-2227-1
Akses
Open Access ✓