DOAJ Open Access 2017

A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components

Xin Cao Zongxi Tang

Abstrak

A wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components. Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction. The measurement standards and fixture are designed based on these two calibration methods. For experimental verification, the multilayered ceramic SMD capacitors of Johanson Technology are measured. The parasitic effects of the SMD capacitors are analyzed. The designed fixture is feasible and applicable for quick and accurate measurement of RF passive SMD components.

Topik & Kata Kunci

Electrical engineering. Electronics. Nuclear engineering Cellular telephone services industry. Wireless telephone industry

Penulis (2)

Xin Cao

Zongxi Tang

Format Sitasi

APA MLA BibTeX

Cao, X., Tang, Z. (2017). A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. https://doi.org/10.1155/2017/7852135

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Informasi Jurnal

Tahun Terbit: 2017
Sumber Database: DOAJ
DOI: 10.1155/2017/7852135
Akses: Open Access ✓