DOAJ
Open Access
2026
Reply to “Comments on ‘Experimental Evaluation of Relationship Between Radiofrequency Heating Near Implanted Conductive Devices, Scanner-Reported B<sub>1+rms</sub>, and Transmit Power’”
David H. Gultekin
J. Thomas Vaughan
Devashish Shrivastava
Abstrak
We describe the relationship between the RF-induced temperature change in a conductive metallic implant during the MRI, B<sub>1+rms</sub>, and RF power for RF pulse sequences, RF coils, and Tx/Rx combinations. We show that both temperature and RF power change with RF pulse sequences, RF coils, and Tx/Rx combinations, whereas B<sub>1+rms</sub> changes only with RF pulse sequences but not RF coils and Tx/Rx combinations. As a result, induced heating is associated with RF power propagation and loss corresponding to the B<sub>1+rms</sub>.
Topik & Kata Kunci
Penulis (3)
D
David H. Gultekin
J
J. Thomas Vaughan
D
Devashish Shrivastava
Format Sitasi
Gultekin, D.H., Vaughan, J.T., Shrivastava, D. (2026). Reply to “Comments on ‘Experimental Evaluation of Relationship Between Radiofrequency Heating Near Implanted Conductive Devices, Scanner-Reported B<sub>1+rms</sub>, and Transmit Power’”. https://doi.org/10.1109/JMW.2026.3666608
Akses Cepat
Informasi Jurnal
- Tahun Terbit
- 2026
- Sumber Database
- DOAJ
- DOI
- 10.1109/JMW.2026.3666608
- Akses
- Open Access ✓