DOAJ Open Access 2024

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Joshua W. Pinder George H. Major Donald R. Baer Jeff Terry James E. Whitten +8 lainnya

Abstrak

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.

Topik & Kata Kunci

Materials of engineering and construction. Mechanics of materials Industrial electrochemistry

Penulis (13)

Joshua W. Pinder

George H. Major

Donald R. Baer

Jeff Terry

James E. Whitten

Jan Čechal

Jacob D. Crossman

Alvaro J. Lizarbe

Samira Jafari

Christopher D. Easton

Jonas Baltrusaitis

Matthijs A. van Spronsen

Matthew R. Linford

Format Sitasi

APA MLA BibTeX

Pinder, J.W., Major, G.H., Baer, D.R., Terry, J., Whitten, J.E., Čechal, J. et al. (2024). Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters. https://doi.org/10.1016/j.apsadv.2023.100534

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Informasi Jurnal

Tahun Terbit: 2024
Sumber Database: DOAJ
DOI: 10.1016/j.apsadv.2023.100534
Akses: Open Access ✓