CrossRef Open Access 2026

The brush model for atomic force microscopy: progress in measuring absolute values of Young's modulus and pericellular layer properties in biological cells and soft matter

Igor Sokolov

Abstrak

Abstract Atomic force microscopy is a powerful tool to measure mechanics of soft materials and cells. Standard methods, like the Hertz model, often yield confusing results because it ignores rough surfaces and the fuzzy pericellular layer surrounding cells. This progress report reviews a better approach, the brush model. This model accounts for the rough, brush-like outer layer of cells and solid surfaces. By separating this surface layer from the main cell body, the model reveals the absolute value of Young’s modulus of the cell body. It also measures the thickness and density of the brush layer itself. We review recent progress with this method, covering its basic theory, lab tests, and error analysis. We also highlight its growing success in detecting cancer and studying diseases. Overall, the brush model provides accurate absolute measurements that improve our understanding of cell mechanics as well as the mechanics of soft materials at the nanoscale.

Penulis (1)

I

Igor Sokolov

Format Sitasi

Sokolov, I. (2026). The brush model for atomic force microscopy: progress in measuring absolute values of Young's modulus and pericellular layer properties in biological cells and soft matter. https://doi.org/10.35848/1347-4065/ae5a43

Akses Cepat

Lihat di Sumber doi.org/10.35848/1347-4065/ae5a43
Informasi Jurnal
Tahun Terbit
2026
Bahasa
en
Sumber Database
CrossRef
DOI
10.35848/1347-4065/ae5a43
Akses
Open Access ✓