Secondary ion emission of a surface quartz resonator coated with silver under bombardment by multiply charged Cs+ and Si+ ions
Abstrak
In this work, we studied secondary ion emission of quarts resonator surface coated silver under bombardment with multiply charged ions of Csq+ and Siq+. For this purpose, the Csq+ and Siq+ ion sources were developed and tested. The experiments were carried out using a modernized magnetic mass spectrometer MI 1201 which has included Csq+ and Siq+ ion sources. The bombarding multiply charged ions had an energy range of 1–10 keV per unit charge. As a result of prolonged ion bombardment, the silver film was etched away, exposing a transitional chromium layer that had been applied to improve adhesion of the silver coating to the quartz. At the boundary of the transition from the silver layer to chromium, cluster ions consisting of cesium, silver, and chromium atoms were observed in the mass spectra, and with further etching, the chromium ion became the main peak in the spectrum. The obtained data demonstrates that the yield of secondary atomic and molecular ions was increasing with growing of number of atoms in bombarded multiply charged ions and this is very distinct for light elements with large ionization potentials.
Penulis (8)
Shovkatjon Akhunov
Ilkhomjon Saydumarov
Shamsiddin Urolov
Saida Iskhakova
Sherzod Akhmedov
Azim Radjabov
Zhan Yu
Dilshadbek Tursunbaevich Usmanov
Akses Cepat
- Tahun Terbit
- 2026
- Bahasa
- en
- Sumber Database
- CrossRef
- DOI
- 10.2139/ssrn.6309150
- Akses
- Terbatas