CrossRef 1973 231 sitasi

The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l

F. Brown W. D. Mackintosh

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F. Brown

W. D. Mackintosh

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Brown, F., Mackintosh, W.D. (1973). The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l. https://doi.org/10.1149/1.2403637

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Informasi Jurnal

Tahun Terbit: 1973
Bahasa: en
Total Sitasi: 231×
Sumber Database: CrossRef
DOI: 10.1149/1.2403637
Akses: Terbatas