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CrossRef Open Access 2008 8 sitasi

Surface Cesium Concentration and Secondary Ion Emission from Si<sub>1-x</sub>Ge<sub>x</sub> Bombarded by Cs<sup>+</sup>

Akira Mikami Tetsuaki Okazawa Yoshiaki Kido
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Penulis (3)

A

Akira Mikami

T

Tetsuaki Okazawa

Y

Yoshiaki Kido

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Mikami, A., Okazawa, T., Kido, Y. (2008). Surface Cesium Concentration and Secondary Ion Emission from Si<sub>1-x</sub>Ge<sub>x</sub> Bombarded by Cs<sup>+</sup>. https://doi.org/10.1143/jjap.47.2234

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Lihat di Sumber doi.org/10.1143/jjap.47.2234
Informasi Jurnal
Tahun Terbit
2008
Bahasa
en
Total Sitasi
8×
Sumber Database
CrossRef
DOI
10.1143/jjap.47.2234
Akses
Open Access ✓