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CrossRef Open Access 2019 44 sitasi

A Sensitivity Map-Based Approach to Profile Defects in MIM Capacitors From <inline-formula> <tex-math notation="LaTeX">${I}$ </tex-math> </inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math> </inline-formula>, <inline-formula> <tex-math notation="LaTeX">${C}$ </tex-math> </inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math> </inline-formula>, and <inline-formula> <tex-math notation="LaTeX">${G}$ </tex-math> </inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math> </inline-formula> Measurements

Andrea Padovani Ben Kaczer Milan Pesic Attilio Belmonte Mihaela Popovici +7 lainnya
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Penulis (12)

A

Andrea Padovani

B

Ben Kaczer

M

Milan Pesic

A

Attilio Belmonte

M

Mihaela Popovici

L

Laura Nyns

D

Dimitri Linten

V

Valeri V. Afanas'ev

I

Ilya Shlyakhov

Y

Younggon Lee

H

Hokyung Park

L

Luca Larcher

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APA MLA BibTeX
Padovani, A., Kaczer, B., Pesic, M., Belmonte, A., Popovici, M., Nyns, L. et al. (2019). A Sensitivity Map-Based Approach to Profile Defects in MIM Capacitors From <inline-formula> <tex-math notation="LaTeX">${I}$ </tex-math> </inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math> </inline-formula>, <inline-formula> <tex-math notation="LaTeX">${C}$ </tex-math> </inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math> </inline-formula>, and <inline-formula> <tex-math notation="LaTeX">${G}$ </tex-math> </inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math> </inline-formula> Measurements. https://doi.org/10.1109/ted.2019.2900030

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Informasi Jurnal
Tahun Terbit
2019
Bahasa
en
Total Sitasi
44×
Sumber Database
CrossRef
DOI
10.1109/ted.2019.2900030
Akses
Open Access ✓