CrossRef 1970 46 sitasi

THICKNESS OF Cs AND Cs–O FILMS ON GaAs(Cs) AND GaAs(Cs–O) PHOTOCATHODES

A. H. Sommer H. H. Whitaker B. F. Williams

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Abstrak

The Cs content of GaAs(Cs) and GaAs(Cs–O) photocathodes was determined by direct chemical analysis. The surface films were found to be of monolayer dimension. From this result, it is concluded that the effect of these films on electron emission is probably not associated with the bulk properties of cesium oxide.

Penulis (3)

A. H. Sommer

H. H. Whitaker

B. F. Williams

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Sommer, A.H., Whitaker, H.H., Williams, B.F. (1970). THICKNESS OF Cs AND Cs–O FILMS ON GaAs(Cs) AND GaAs(Cs–O) PHOTOCATHODES. https://doi.org/10.1063/1.1653398

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Lihat di Sumber doi.org/10.1063/1.1653398

Informasi Jurnal

Tahun Terbit: 1970
Bahasa: en
Total Sitasi: 46×
Sumber Database: CrossRef
DOI: 10.1063/1.1653398
Akses: Terbatas