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CrossRef Open Access 2025 2 sitasi

Accelerating domain-aware electron microscopy analysis using deep learning models with synthetic data and image-wide confidence scoring

M. J. Lynch R. Jacobs G. A. Bruno P. Patki D. Morgan +1 lainnya
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Penulis (6)

M

M. J. Lynch

R

R. Jacobs

G

G. A. Bruno

P

P. Patki

D

D. Morgan

K

K. G. Field

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APA MLA BibTeX
Lynch, M.J., Jacobs, R., Bruno, G.A., Patki, P., Morgan, D., Field, K.G. (2025). Accelerating domain-aware electron microscopy analysis using deep learning models with synthetic data and image-wide confidence scoring. https://doi.org/10.1038/s41524-025-01756-6

Akses Cepat

Lihat di Sumber doi.org/10.1038/s41524-025-01756-6
Informasi Jurnal
Tahun Terbit
2025
Bahasa
en
Total Sitasi
2×
Sumber Database
CrossRef
DOI
10.1038/s41524-025-01756-6
Akses
Open Access ✓