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CrossRef Open Access 2012 1 sitasi

Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy

T. Sasaki H. Sawada F. Hosokawa T. Kaneyama Y. Kondo +2 lainnya
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Abstrak

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Penulis (7)

T

T. Sasaki

H

H. Sawada

F

F. Hosokawa

T

T. Kaneyama

Y

Y. Kondo

K

K. Kimoto

K

K. Suenaga

Format Sitasi

APA MLA BibTeX
Sasaki, T., Sawada, H., Hosokawa, F., Kaneyama, T., Kondo, Y., Kimoto, K. et al. (2012). Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy. https://doi.org/10.1017/s1431927612009427

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Informasi Jurnal
Tahun Terbit
2012
Bahasa
en
Total Sitasi
1×
Sumber Database
CrossRef
DOI
10.1017/s1431927612009427
Akses
Open Access ✓