CrossRef Open Access 2003 9 sitasi

Transient effects induced through ripple topography growth during Cs+ depth profile analysis of Si at high incidence angles

P.A.W. van der Heide M.S. Lim S.S. Perry J. Bennett

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P.A.W. van der Heide

M.S. Lim

S.S. Perry

J. Bennett

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Heide, P.v.d., Lim, M., Perry, S., Bennett, J. (2003). Transient effects induced through ripple topography growth during Cs+ depth profile analysis of Si at high incidence angles. https://doi.org/10.1016/s0169-4332(02)00721-3

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Informasi Jurnal

Tahun Terbit: 2003
Bahasa: en
Total Sitasi: 9×
Sumber Database: CrossRef
DOI: 10.1016/s0169-4332(02)00721-3
Akses: Open Access ✓