CrossRef Open Access 2003 21 sitasi

Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs+

P.A.W. van der Heide F.V. Azzarello

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P.A.W. van der Heide

F.V. Azzarello

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Heide, P.v.d., Azzarello, F. (2003). Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs+. https://doi.org/10.1016/s0039-6028(03)00536-3

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Informasi Jurnal

Tahun Terbit: 2003
Bahasa: en
Total Sitasi: 21×
Sumber Database: CrossRef
DOI: 10.1016/s0039-6028(03)00536-3
Akses: Open Access ✓