CrossRef Open Access 1998 448 sitasi

Submicron deformation field measurements: Part 2. Improved digital image correlation

G. Vendroux W. G. Knauss

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G. Vendroux

W. G. Knauss

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Vendroux, G., Knauss, W.G. (1998). Submicron deformation field measurements: Part 2. Improved digital image correlation. https://doi.org/10.1007/bf02321649

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Informasi Jurnal

Tahun Terbit: 1998
Bahasa: en
Total Sitasi: 448×
Sumber Database: CrossRef
DOI: 10.1007/bf02321649
Akses: Open Access ✓