arXiv Open Access 2022

High-Throughput, High-Performance Deep Learning-Driven Light Guide Plate Surface Visual Quality Inspection Tailored for Real-World Manufacturing Environments

Carol Xu Mahmoud Famouri Gautam Bathla Mohammad Javad Shafiee Alexander Wong
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Abstrak

Light guide plates are essential optical components widely used in a diverse range of applications ranging from medical lighting fixtures to back-lit TV displays. In this work, we introduce a fully-integrated, high-throughput, high-performance deep learning-driven workflow for light guide plate surface visual quality inspection (VQI) tailored for real-world manufacturing environments. To enable automated VQI on the edge computing within the fully-integrated VQI system, a highly compact deep anti-aliased attention condenser neural network (which we name LightDefectNet) tailored specifically for light guide plate surface defect detection in resource-constrained scenarios was created via machine-driven design exploration with computational and "best-practices" constraints as well as L_1 paired classification discrepancy loss. Experiments show that LightDetectNet achieves a detection accuracy of ~98.2% on the LGPSDD benchmark while having just 770K parameters (~33X and ~6.9X lower than ResNet-50 and EfficientNet-B0, respectively) and ~93M FLOPs (~88X and ~8.4X lower than ResNet-50 and EfficientNet-B0, respectively) and ~8.8X faster inference speed than EfficientNet-B0 on an embedded ARM processor. As such, the proposed deep learning-driven workflow, integrated with the aforementioned LightDefectNet neural network, is highly suited for high-throughput, high-performance light plate surface VQI within real-world manufacturing environments.

Topik & Kata Kunci

Penulis (5)

C

Carol Xu

M

Mahmoud Famouri

G

Gautam Bathla

M

Mohammad Javad Shafiee

A

Alexander Wong

Format Sitasi

Xu, C., Famouri, M., Bathla, G., Shafiee, M.J., Wong, A. (2022). High-Throughput, High-Performance Deep Learning-Driven Light Guide Plate Surface Visual Quality Inspection Tailored for Real-World Manufacturing Environments. https://arxiv.org/abs/2212.10632

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2022
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en
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arXiv
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Open Access ✓